International Journal of Engineering Research in Electronics and Communication Engineering

Effect of Ultrasonic stress in Semiconductor Materials and Devices

Author : Awadhesh Prasad ¹

Date of Publication :21st December 2016

Abstract: Effect of Ultrasonic Stress in solid state devices and materials have been discussed with the help of electromagnetic wave theory. Ultrasonic stress (radiation pressure) changes the characteristics of solid state devices and materials. Analytical treatment of changed characteristics of solid state devices and materials have been discussed.

Reference :

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