Open Access Journal

ISSN : 2456-1304 (Online)

International Journal of Engineering Research in Electronics and Communication Engineering(IJERECE)

Monthly Journal for Electronics and Communication Engineering

Open Access Journal

International Journal of Science Engineering and Management (IJSEM)

Monthly Journal for Science Engineering and Management

ISSN : 2456-1304 (Online)

Attenuation and its Effect on Measurement of Ultrasonic Radiation Pressure

Author : Awadhesh Prasad 1

Date of Publication :19th January 2017

Abstract: Attenuation is defined as the decrease in power level at the load caused by inserting a device between a source and load. Effect of Ultrasonic stress has been studied in the solid state devices and its output is observed for discussions. Effect of attenuation in the measurement of Ultrasonic Radiation Pressure has been discussed analytically

Reference :

    1. V. R. Singh and Awadhesh Prasad, “Effect of Ultrasonic stress on the sensitivity of Silicon Strain devices and application to acoustic power measurement” Sensors and Actuators A., Elsevier Squoia, Lausanne, Netherlands, Vol. 28, pp 7 – 11, 1991.
    2.  V. R. Singh and Awadhesh Prasad, “Effect of Ultrasonic Stress on Amplification of an Operational Amplifier Device”, Applied Acoustics, UK, Vol 27, pp 69 – 73, 1989. 3. V. R. Singh and Awadhesh Prasad, “Acoustoelectric Effect in semiconductor materials and devices”, Chinese Journal of Acoustics, Vol. 9, No. 3, pp 275 – 279, 1990.
    3.  V. R. Singh, Awadhesh Prasad and Sanjay Yadav, “Ultrasonic Stress Effect on a Germanium Based Junction Transistor”, Acustica, Great Britain, Vol. 71, pp 79 – 80, 1990.
    4. Awadhesh Prasad and V. R. Singh, “Characteristics of Silicon Laser p-i-n photodiodes in Ultrasonic Field”, IETE, New Delhi, Technical Review, Vol. 7, No. 1, pp 64 – 65, 1990.
    5. V. R. Singh and Awadhesh Prasad, “Technical Note: Effect of Ultrasonic Stress on offset voltage of operational Amplifier Devices”, Noise control Engineering Journal, USA, Vol. 35 No.2, pp 65 – 67, 1990.

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